WebIONTOF's success is based on the longstanding experience in the field and the skills of our scientists and engineers. Vision One can only be successful if deep understanding of the … WebDie IONTOF GmbH vertreibt, produziert und wartet die Analysegeräte. Die IONTOF Technologies GmbH betreut alle F&E-Projekte. Die Tochtergesellschaften IONTOF USA …
IONTOF GmbH, Münster- Firmenprofil
Web48149 Münster Germany Phone +49 (0)251 1622 100 Fax +49 (0)251 1622 199 [email protected] www.iontof.com Web3 jul. 2024 · ToF-SIMS measurements were performed with a TOF.SIMS 5 instrument (IONTOF, Münster, Germany) using a focused 25 keV bismuth cluster ion beam (Bi 3 +) at a typical current of 0.3 pA. To obtain ToF-SIMS mass spectra, the process was initially performed for a positive ion spectrum using a \({\text{Bi}}_{3}^{ + }\) ion beam. bit in the behind
ION-TOF EMRS
WebAt this time, a unique technology for surface analysis arises in the Münster university laboratory. In 1989 IONTOF GmbH is founded in Münster. It continues the development, … Web29 mrt. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … The M6 Plus - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... SurfaceLab 7 - IONTOF - TOF-SIMS (time of flight secondary ion mass … Tof-Sims - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Low Energy Ion Scattering - IONTOF - TOF-SIMS (time of flight secondary ion … With the Q Exactive TM extension for the M6, IONTOF provides the first … For this reason, the IONTOF service department is available around the … Sales - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Applications - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... WebIn this work, the use of Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) was explored as a technique for monitoring the interfacial retro Diels–Alder (retro DA) reaction occurring on... bit in the